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Dokumentenidentifikation EP1058337 03.08.2006
EP-Veröffentlichungsnummer 0001058337
Titel Verzögerungsleitung
Anmelder Murata Manufacturing Co., Ltd., Nagaokakyo, Kyoto, JP
Erfinder Tsuru, Teruhisa, Nagaokakyo-shi, Kyoto-fu 617-8555, JP;
Matsumoto, Mitsuhiro, Nagaokakyo-shi, Kyoto-fu 617-8555, JP
Vertreter Schoppe, Zimmermann, Stöckeler & Zinkler, 82049 Pullach
DE-Aktenzeichen 60028867
Vertragsstaaten DE, FI, FR, SE
Sprache des Dokument EN
EP-Anmeldetag 29.05.2000
EP-Aktenzeichen 001114974
EP-Offenlegungsdatum 06.12.2000
EP date of grant 21.06.2006
Veröffentlichungstag im Patentblatt 03.08.2006
IPC-Hauptklasse H01P 9/00(2006.01)A, F, I, 20051017, B, H, EP

Beschreibung[en]
BACKGROUND OF THE INVENTION 1. Field of the Invention

The present invention relates to delay lines used for delaying signal transmission in computers, measurement apparatuses, and the like. More specifically, the invention relates to delay lines in which delay time can be adjusted.

2. Description of the Related Art

Fig. 9 is a top view of a prior art example of a delay line. A delay line 80 has a structure in which a transmission line 82 used for a signal line is folded in a meandering manner and disposed on one of the main surfaces of a dielectric substrate 81, and a ground conductor (not shown) is disposed on substantially all of the other main surface of the dielectric substrate 81. The ends of the transmission line 82 arc connected to an input terminal 83, and an output terminal 84, respectively. The entire length of the transmission line 82 determines the delay time between the input terminal 83 and the output terminal 84. In order to change the delay time, as shown in Fig. 9, an intermediate tap terminal 85 is disposed at a certain point on the meandering transmission line 82 and used, for example, as an output terminal, thereby providing a different delay time. The intermediate tap terminal 85 is adapted to be connected to the transmission line 82 at different positions, whereby the delay time can be changed by changing the position.

However, in the case of the above delay line, when the position of an output terminal has been set according to a desired delay time, it is impossible to adjust the delay time again, after the delay line has been mounted in a printed circuit board or the like.

In addition, since one of the three terminals is not used, the unused terminal generates a capacitance or works as a stub, which leads to a problem of causing the reflection of a signal.

In addition, as shown in Fig. 9, when a transmission line to be used has a meandering configuration, an intermediate tap terminal can be connected only to the lower-side curved part of the meandering transmission line. As a result, it is impossible to adjust delay time continuously.

A method for manufacturing a chip type delay element is disclosed in JP 62097416 A. A coil pattern made of a conductor such as copper and connected to a wide part is formed on a board made of a dielectric such as ceramic. Then, an electrode pattern connected to an earth pattern made of a conductor such as copper is formed opposing the wide part at a prescribed interval. In adjusting the delay time by the adjustment of capacitance, any opposed pattern is subject to trimming by using a laser or the like. It is desirable to narrower the gap between the wide part and the electrode pattern more than the design value.

A lumped-parameter, electrical delay line having shunt capacitance including variable-capacitance diodes is described in US-A-4701714. A tuning voltage applied to the diodes provides electrically variable delay at low jitter and stable insertion delay.

To overcome the above described problems, embodiments of the present invention provide a delay line in which delay time can be adjusted even after being mounted on a printed circuit board, and in which the delay time can continuously be adjusted.

This object is achieved by a delay line according to claim 1.

According to the above described structure and arrangement, by changing the capacitance, a frequency of an attenuation pole in the pass characteristic of the delay line can be continuously changed even after the delay line is mounted on a printed circuit board. As a result, the delay time of the delay line can be continuously changed so as to obtain a desired delay time.

According to the invention, the transmission line is formed inside the multilayer structure in which the plurality of the dielectric layers are laminated. Therefore, the wiring between the transmission line and the variable capacitor can also be formed inside the multilayer structure. Therefore, losses caused by the wiring can be suppressed, and it is possible to obtain a delay line having more satisfactory characteristics.

Other features and advantages of the present invention will become apparent from the following description of embodiments of the invention which refers to the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

  • Fig. 1A shows a top view of a delay line, and Fig. 1B shows a sectional view thereof.
  • Fig. 2 shows an equivalent circuit diagram of the delay line shown in Figs. 1A and 1B.
  • Fig. 3 shows a graph illustrating the pass characteristics of the delay line shown in Figs. 1A and 1B, and the frequency dependence of the delay time of the delay line.
  • Fig. 4 shows a graph illustrating the capacitance dependence of the delay time of the delay line shown in Figs. 1A and 1B.
  • Fig. 5 is an exploded perspective view of a delay line according to a first embodiment of the present invention.
  • Fig. 6 is a sectional view of a modified example of the delay line shown in Fig. 5.
  • Fig. 7 is an exploded perspective view of a delay line according to a second embodiment of the present invention.
  • Fig. 8 is a graph illustrating an applied voltage dependence of the delay time of the delay line shown in Fig. 7.
  • Fig. 9 is a top view illustrating a prior art delay line.

DETAILED DESCRIPTION OF EMBODIMENTS OF THE INVENTION

Fig. 1A shows a top view of a delay line, and Fig. 1B shows a sectional view thereof. A delay line 10 has a dielectric substrate 11. A transmission line 12 used for a signal line is disposed on one of the main surfaces of the dielectric substrate 11. The transmission line 12 is folded in a meandering manner. On substantially the entire back surface of the dielectric substrate 11, a ground conductor 13 is formed.

A variable capacitance trimmer capacitor 14 is connected in parallel to the transmission line 12. In addition, the ends of the transmission line 12 are connected to an input terminal 15 and an output terminal 16, respectively. The ground conductor 13 is connected to ground terminals 17 and 18, respectively.

Fig. 2 is an equivalent circuit diagram of the delay line shown in Fig. 1. The delay line 10 has a structure in which an inductance component L of a micro strip line formed by the transmission line 12 and the ground conductor 13 are connected in parallel to a capacitance C of the trimmer capacitor 14 between the input terminal 15 and the output terminal 16.

In addition, in the pass characteristics, an attenuation pole is generated at a frequency obtained by an expression 1/(2&pgr; (L · C) S). With the attenuation pole, phase changes occur in high frequency signals passing through the transmission line 12. As a result, the delay time of the delay line 10 changes according to frequency.

Fig. 3 shows a graph illustrating the pass characteristic of the delay line 10 shown in Fig. 1, and the frequency dependence of delay time thereof. In this figure, a solid line P indicates the pass characteristic, and a broken line D indicates the delay time. The inductance component L of the transmission line 12 is 20 (nH), and the capacitance C of the trimmer capacitor 14 is 0.5 (pF).

This figure shows that, in the pass characteristics, an attenuation pole occurs near a frequency of 1.6 (GHz) obtained by the expression 1/(2&pgr; (L · C) S), and duc to the influence of the attenuation pole, the delay time greatly changes.

Fig. 4 is a graph illustrating the capacitance dependence of the delay time of the delay line 10 shown in Fig. 1. In Fig. 4, the horizontal axis of the graph indicates the capacitance of the trimmer capacitor 14, and the vertical axis thereof indicates the delay time of the delay line 10. In addition, a solid line D1 shows changes of the delay time at a frequency of 1.5 GHz, and a broken line D2 shows changes of the delay time at a frequency of 1.7 GHz.

This figure shows that adjustment of the capacitance of the trimmer capacitor 14 permits the delay time of the delay line 10 to be adjusted. The reason for this is that when the capacitance of the trimmer capacitor 14 is changed, the frequency of the attenuation pole, which is obtained by the expression 1/(2&pgr; (L · C) S), also changes.

In the delay line described above, since the variable trimmer capacitor is connected in parallel to the transmission line, continuously changing the capacitance of the trimmer capacitor also continuously changes the frequency at which the attenuation pole occurs in the pass characteristic. As a result, it is possible to continuously change the delay time of the delay line so as to obtain a desired delay time.

Fig. 5 is an exploded perspective view of a delay line according to a first embodiment of the present invention. A delay line 20 has a rectangular-parallelepiped multilayer structure 21 obtained by sequentially laminating rectangular dielectric layers 211 to 215 formed of dielectric ceramic materials (relative permittivity &egr;r :approximately 6.0), whose main components comprise barium oxide, aluminum oxide, and silica, bonding by pressurizing and then integrally firing at temperatures of 800 to 1000°C. On the side surfaces and upper and lower surfaces of the multilayer structure 21, an input terminal 22, an output terminal 23, and two ground terminals 24 and 25 are formed.

Substantially rectangular ground conductors 261 and 262 are formed on the upper surfaces of the dielectric layers 211 and 213, respectively. In addition, a transmission line 27 is disposed on the upper surface of the dielectric layer 212 in a substantially meandering form. Furthermore, substantially rectangular capacitor electrodes 281 and 282 are formed on the upper surfaces of the dielectric layers 214 and 215, respectively.

In this case, both ends of the transmission line 27 formed on the upper surface of the dielectric layer 212, and parts of the ground conductors 261 and 262 formed on the upper surfaces of the dielectric layers 211 and 213 are extended onto the side surfaces of the multilayer structure 21 to be connected to the input terminal 22, the output terminal 23, and the ground terminals 24 and 25, respectively.

In addition, an end of the transmission line 27 on the upper surface of the dielectric layer 212 is connected to the capacitor electrode 281 on the upper surface of the dielectric layer 214 by a via-hole conductor 291 disposed in such a manner that the via-holc conductor 291 passes through the dielectric layers 213 and 214.

Furthermore, the other end of the transmission line 27 on the upper surface of the dielectric layer 212 is connected to the capacitor electrode 282 on the upper surface of the dielectric layer 215 by a via-hole conductor 292 disposed in such a manner that the via-hole conductor 291 passes through the dielectric layers 213 to 215.

With such a structure, in the delay line 20, between the input terminal 22 and the output terminal 23, the inductance component L of the strip line formed by the transmission line 27 and the ground conductors 261 and 262 is connected in parallel to the capacitance component C of the variable capacitor 28 formed by the capacitor electrodes 281 and 282.

In this case, the equivalent circuit of the delay line 20 is the same as the equivalent circuit of the delay line 10 shown in Fig. 2.

The input terminal 22, the output terminal 23, and the ground terminals 24 and 25 are formed by firing printed conductive paste simultaneously with the multilayer structure 21, or by baking the printed conductive paste after the multilayer structure 21 has been fired.

After this, the capacitor electrode 282 formed on the upper surface of the multilayer structure 21 is trimmed by a laser or the like, by which the capacitance of the variable capacitor 28 can be continuously changed to set the delay time of the delay line 20, as in the delay line 10 (Fig. 1).

Fig. 6 is a sectional view of a modified example of the delay line shown in Fig. 5. When compared with the delay line 20 shown in Fig. 5, the structure of the delay line 20a is different in that it includes a trimmer capacitor 28a, as an alternative to the variable capacitor 28 (Fig. 5) formed by the capacitor electrodes 281 and 282, on the upper surface of the multilayer structure 21a having ground conductors 261a and 262a, and a transmission line 27a formed therein.

In this case, the transmission line 27a is connected to the trimmer capacitor 28a by via-hole conductors 291a and 292a disposed inside the multilayer structure 21a.

In the delay line of the first embodiment described above, since the capacitance of the trimmer capacitor can be continuously changed, even after being mounted on a printed circuit board, a frequency at which an attenuation pole occurs in the pass characteristics can also be continuously changed. As a result, the delay time of the delay line can be continuously changed so as to obtain a desired delay time.

In addition, since the transmission line is formed inside the multilayer structure in which the plurality of the dielectric layers are laminated, the wiring between the transmission line and the variable capacitor can be formed inside the multilayer structure. As a result, losses caused by the wiring can be suppressed, and a delay line having more satisfactory characteristics can thereby be obtained.

Fig. 7 is an exploded perspective view of a delay line according to a second embodiment of the present invention. A delay line 30 has a rectangular-parallelepiped multilayer structure 31 obtained by sequentially laminating rectangular dielectric layers 311 to 314 formed of dielectric ceramic materials (relative permittivity &egr;r : approximately 6.0), whose main components comprise barium oxide, aluminum oxide, and silica, bonding by pressurizing, and then integrally firing at temperatures of 800 to 1000° C.

A varicap diode 32 is mounted on the upper surface of the multilayer structure 31. An input terminal 33, an output terminal 34, and two ground terminals 35 and 36 arc formed on the side surfaces of the multilayer structure 31, and the upper and lower surfaces thereof.

Substantially rectangular ground conductors 371 and 372 are formed on the upper surfaces of the dielectric layers 311 and 313. In addition, a transmission line 38 having a substantially meandering configuration is formed on the upper surface of the dielectric layer 312.

In this case, both ends of the transmission line 38 formed on the dielectric layer 312, and parts of the ground conductors 371 and 372 formed on the upper surfaces of the dielectric layers 311 and 313 are extended onto the side surfaces of the multilayer structure 31 to be connected to the input terminal 33, the output terminal 34, and the ground terminals 35 and 36, respectively.

In addition, an end of the transmission line 38 on the upper surface of the dielectric layer 312 is connected to an end of the varicap diode 32 mounted on the multilayer structure 31 by a via-hole conductor 391 disposed in such a manner that the via-hole conductor 391 passes through the dielectric layers 313 and 314.

Furthermore, the other end of the transmission line 38 on the upper surface of the dielectric layer 312 is connected to the other end of the varicap diode 32 mounted on the multilayer structure 31 by a via-hole conductor 392 disposed in such a manner that the via-hole conductor 392 passes through the dielectric layers 313 and 314.

With such an arrangement, in the delay line 30, between the input terminal 33 and the output terminal 34, the inductance component L of the strip line formed by the transmission line 38 and the ground conductors 371 and 372 are connected in parallel to the capacitance component C of the varicap diode 32.

In this case, the equivalent circuit of the delay line 30 is the same as the equivalent circuit of the delay line 10 shown in Fig. 2

As in the case of the delay line 20 of the first embodiment, the input terminal 33, the output terminal 34, and the ground terminals 35 and 36 are formed either by firing printed conductive paste simultaneously with the multilayer structure 31, or by baking the printed conductive paste after the multilayer structure 31 is fired.

With this structure by changing the voltage applied to the varicap diode 32 mounted on the upper surface of the multilayer structure 31, the capacitance component of the varicap diode 32 can also be changed continuously. As a result, the delay time of the delay line 30 can be continuously changed, as in the cases of the delay lines 10 (Fig. 1) and 20 (Fig. 5) of the first and second embodiments.

Fig. 8 is a graph showing changes of the delay time of the delay line shown in Fig. 7. In Fig. 8, the horizontal axis of the graph indicates a voltage applied to the diode 32, and the vertical axis thereof indicates the delay time of the delay line. A solid line D3 shows changes of the delay time at a frequency of 1.5 GHz, and a broken line D4 shows changes of the delay time at a frequency of 1.7 GHz.

This graph shows that, when the voltage applied to the varicap diode 32 is changed, the delay time of the transmission line 38 can be changed. The reason for this is that changing the voltage applied to the varicap diode 32 changes the capacitance component of the varicap diode 32, by which a frequency at which the attenuation pole occurs in the pass characteristics is also changed, since the varicap diode is connected in parallel to the transmission line.

In the first and second embodiments, the dielectric layers have been formed of ceramic materials whose main components comprise barium oxide, aluminum oxide, and silica. However, any material can be used as long as the value of the relative pennittivity (&egr;r) is 1 or greater. For example, a ceramic material whose components comprise magnesium oxide and silica or a material of fluoropolymers can be used to obtain the same advantages.

In addition, a description has been given of cases in which either a variable capacitor or a diode is connected to the transmission line. Alternatively, both a variable capacitor and a diode may be connected to the transmission line, advantageously is parallel thereto.

In the first and second embodiments, the ground conductors are disposed inside the multilayer structure. However, any way of arranging the ground conductors can be applied as long as the dielectric layer is disposed between the transmission line and the ground conductors. Alternatively, the ground conductors may be disposed on outer surfaces of the multilayer structure.

In addition, in the above description, via-hole conductors are used for connecting the transmission line to the variable-capacity capacitor and the diode, respectively. Alternatively, the same advantages can also be obtained by using through-hole conductors.

Further, although all of the disclosed embodiments have the equivalent circuit shown in Fig. 3, other circuit arrangements may be used as long as a variable capacitance is connected to a transmission line so as to be able to continuously adjust a desired delay time of the delay line.


Anspruch[de]
Eine Verzögerungsleitung mit folgenden Merkmalen: einer Mehrschichtstruktur (21; 31), die durch ein Laminieren einer Mehrzahl dielektrischer Schichten (211, 212, 213, 214, 215; 311, 312, 313, 314) gebildet ist; einer Übertragungsleitung (27; 38), die auf einer dielektrischen Schicht (212; 312) gebildet ist, die in die Mehrschichtstruktur (21; 31) eingebettet ist; und einer Mehrzahl von Masseleitern (24, 25, 261, 262; 35, 36, 371, 372), die auf den dielektrischen Schichten angeordnet sind, wobei ein Paar (24, 25; 35, 36) der Masseleiter (24, 25, 261, 262; 35, 36, 371, 372) auf gegenüberliegenden Seiten der Übertragungsleitung (27; 38) angeordnet ist; gekennzeichnet durch eine einstellbare Kapazität (28; 32), die auf der Mehrschichtstruktur (21; 31) angeordnet und parallel zu der Übertragungsleitung (27; 38) geschaltet ist, zum Setzen einer erwünschten Verzögerungszeit der Verzögerungsleitung. Eine Verzögerungsleitung gemäß Anspruch 1, bei der die Kapazität (28) durch Elektroden (281, 282), die auf jeweiligen (214, 215) der dielektrischen Schichten (211 - 215) gebildet sind, bereitgestellt wird. Eine Verzögerungsleitung gemäß Anspruch 1, bei der die Kapazität (28) durch eine variable Kondensator bereitgestellt wird. Eine Verzögerungsleitung gemäß Anspruch 1, bei der die Kapazität (32) durch eine Varicap-Diode (32) bereitgestellt wird. Eine Verzögerungsleitung gemäß Anspruch 1, bei der die Kapazität (32) durch eine Diode bereitgestellt wird. Eine Verzögerungsleitung gemäß Anspruch 5, bei der die Diode eine Varicap-Diode ist.
Anspruch[en]
A delay line comprising: a multilayer structure (21; 31) formed by laminating a plurality of dielectric layers (211, 212, 213, 214, 215; 311, 312, 313, 314); a transmission line (27; 38) formed on a dielectric layer (212; 312) embedded in the multilayer structure (21; 31); and a plurality of ground conductors (24, 25, 261, 262; 35, 36, 371, 372) disposed on the dielectric layers and a pair (24, 25; 35, 36) of said ground conductors (24, 25, 261, 262; 35, 36, 371, 372) being disposed on opposite sides of the transmission line (27; 38); characterized by an adjustable capacitance (28; 32) disposed on the multilayer structure (21; 31) and connected in parallel to the transmission line (27; 38) for setting a desired delay time of the delay line. A delay line according to claim 1, wherein said capacitance (28) is provided by electrodes (281,282) formed on respective ones (214, 215) of said dielectric layers (211-215). A delay line according to claim 1, wherein said capacitance (28) is provided by a variable capacitor. A delay line according to claim 1, wherein said capacitance (32) is provided by a varicap diode (32). A delay line according to claim 1, wherein said capacitance (32) is provided by a diode. A delay line according to claim 5, wherein said diode is a varicap diode.
Anspruch[fr]
Ligne à retard, comprenant : une structure multicouche (21 ; 31) formée par stratification d'une pluralité de couches diélectriques (211, 212, 213, 214, 215 ; 311, 312, 313, 314) ; une ligne de transmission (27 ; 38) formée sur une couche diélectrique (212 ; 312) immergée dans la structure multicouche (21 ; 31) ; et une pluralité de conducteurs de mise à la terre (24, 25, 261, 262; 35, 36, 371, 372) disposés sur les couches diélectriques et une paire (24, 25, 35, 36) desdits conducteurs de mise à la terre (24, 25, 261, 262 ; 35, 36, 371, 372) étant disposés de part et d'autre de la ligne de transmission (27 ; 38) ; caractérisé par une capacité ajustable (28 ; 32) disposée sur la structure multicouche (21 ; 31) et connectée en parallèle à la ligne de transmission (27 ; 38) afin d'ajuster un temps de retard voulu pour la ligne à retard. Ligne à retard selon la revendication 1, où ladite capacité (28) est dotée d'électrodes (281, 282) formées sur des couches respectives (214, 215) parmi lesdites couches diélectriques (211 à 215). Ligne à retard selon la revendication 1, où ladite capacité (28) est produite par un condensateur variable. Ligne à retard selon la revendication 1, où ladite capacité (32) est produite par une diode varicap (32). Ligne à retard selon la revendication 1, où ladite capacité (32) est produite par une diode. Ligne à retard selon la revendication 5, où ladite diode est une diode varicap.






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